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Measurement of Optical Excitations in Low-Dimensional Materials by Using a Monochromated Electron Source

Published online by Cambridge University Press:  01 August 2018

Ryosuke Senga
Affiliation:
Nano-Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
Thomas Pichler
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria
Kazu Suenaga
Affiliation:
Nano-Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
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Abstract

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© Microscopy Society of America 2018 

References

[1] Crochet, J. J., et al, Nature Nanotech 7 2012 126.CrossRefGoogle Scholar
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[4] Tizei, L. H. G., et al, Phys. Rev. Lett. 114 2015 107601.CrossRefGoogle Scholar
[5] Lin, J., et al, Nano Lett. 16 2016 7198.CrossRefGoogle Scholar
[6] Sato, Y. Terauchi, M. Microsc. Microanal. 20 2014 807.CrossRefGoogle Scholar
[7] Senga, R., et al, Nano Lett. 16 2016 3661.CrossRefGoogle Scholar
[8] Hage, F. S., et al, Phys. Rev. B 95 2017 195411.CrossRefGoogle Scholar
[9] Wei, X., et al, Nature Comm 7 2016 12899.CrossRefGoogle Scholar
[10] RS acknowledge funding from JSPS KAKENHI, 17H04797. Dr. H Kataura is thanked for their sample preparations..Google Scholar
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