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Measurement of Detection Efficiency in Atom Probe Tomography

Published online by Cambridge University Press:  27 August 2014

T.J. Prosa ,
B.P. Geiser ,
R.M. Ulfig ,
T.F. Kelly  and
D.J. Larson
T.J. Prosa
Affiliation:
CAMECA Instruments, Inc. 5500 Nobel Drive, Madison, WI USA
B.P. Geiser
Affiliation:
CAMECA Instruments, Inc. 5500 Nobel Drive, Madison, WI USA
R.M. Ulfig
Affiliation:
CAMECA Instruments, Inc. 5500 Nobel Drive, Madison, WI USA
T.F. Kelly
Affiliation:
CAMECA Instruments, Inc. 5500 Nobel Drive, Madison, WI USA
D.J. Larson
Affiliation:
CAMECA Instruments, Inc. 5500 Nobel Drive, Madison, WI USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1160 - 1161
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Kelly, T.F. & Larson, D.J. Ann. Rev. Mat. Res. 42 (2012), p. 1.Google Scholar
[2] Geiser, B.P., et al, Microsc. Microanal. 13 (2007), p. 437.Google Scholar
[3] Deconihout, B., et al, Rev. Sci. Inst. 73 (2002), p. 1734.Google Scholar