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Mean Angular Deviation Minimization To Determine Lattice Parameters in Transmission Kikuchi Diffraction

Published online by Cambridge University Press:  30 July 2021

Xin Yi Ling ,
Jared Lodico ,
B. C. Regan  and
Matthew Mecklenburg
Xin Yi Ling
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States, Los Angeles, California, United States
Jared Lodico
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States, United States
B. C. Regan
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, California 90095, United States, United States
Matthew Mecklenburg*
Affiliation:
Core Center of Excellence in Nano Imaging (CNI), University of Southern California, Los Angeles, California 90089, United States, United States
*
*Corresponding author: matthew.mecklenburg@usc.edu

Abstract

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Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1608 - 1609
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Nagaya, T. et al. Minimizing and quantifying mis-indexing in electron backscatter diffraction (EBSD) determinations of antigorite crystal directions. Journal of Structural Geology 95, 127–141 (2017).CrossRefGoogle Scholar
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Yang, L. et al. Lattice strain effects on the optical properties of MoS2 nanosheets. Scientific Reports 4, 5649 (2014).CrossRefGoogle ScholarPubMed
Hong, J. et al. Exploring atomic defects in molybdenum disulphide monolayers. Nature Communications 6, 6293 (2015).CrossRefGoogle ScholarPubMed
The data was acquired at the Core Center of Excellence in Nano Imaging (CNI), University of Southern California. This work was supported by National Science Foundation (NSF) Science and Technology Center (STC) award DMR-1548924 (STROBE) and by NSF award DMR-2004897.Google Scholar