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Making the Stitching Process of Montaged SEM Images Automatic Using Fourier Transform Properties

Published online by Cambridge University Press:  30 July 2021

Nasim Khoonkari ,
Christopher Anand  and
Nabil Bassim
Nasim Khoonkari
Affiliation:
Computing and Software Department, McMaster University, Hamilton, Ontario, Canada, Hamilton, Ontario, Canada
Christopher Anand
Affiliation:
Computing and Software Department, McMaster University, Hamilton, Ontario, Canada, Canada
Nabil Bassim
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada, Hamilton, Ontario, Canada

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 478 - 480
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Chalfoun, Joe and Majurski, Michael and Blattner, Tim and Bhadriraju, Kiran and Keyrouz, Walid and Bajcsy, Peter and Brady, Mary Mist: accurate and scalable microscopy image stitching tool with stage modeling and error minimization, Scientific reports, Nature Publishing Group, vol 7(1), 2017.CrossRefGoogle Scholar
Mahalakshmi, T and Muthaiah, R and Swaminathan, P Image Processing, Research Journal of Applied Sciences, Engineering and Technology, vol 4(24), 2012.Google Scholar
Eberle, Anna Lena and Garbowski, Tomasz Large-Scale Automated Serial Section Imaging with a Multibeam Scanning Electron Microscope, Springer, vol Microscopy, 2020.CrossRefGoogle Scholar