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Making Compressive Sensing Accessible in Scientific Imaging

Published online by Cambridge University Press:  05 August 2019

Andrew Stevens
Affiliation:
Sivananthan Laboratories, Sensor Analytics, Bolingbrook, ILUSA
Houari Amari
Affiliation:
University of Liverpool, Mechanical, Materials & Aerospace Eng, LiverpoolUK
Christopher Buurma
Affiliation:
Sivananthan Laboratories, Sensor Analytics, Bolingbrook, ILUSA
Benjamin Bammes
Affiliation:
Direct Electron, San Diego, CAUSA
Dineth Wije
Affiliation:
Sivananthan Laboratories, Sensor Analytics, Bolingbrook, ILUSA
Daniel Nicholls
Affiliation:
University of Liverpool, Mechanical, Materials & Aerospace Eng, LiverpoolUK
Nathan Johnson
Affiliation:
University of Liverpool, Mechanical, Materials & Aerospace Eng, LiverpoolUK
Robert Bilhorn
Affiliation:
Direct Electron, San Diego, CAUSA
Nigel D. Browning
Affiliation:
Sivananthan Laboratories, Sensor Analytics, Bolingbrook, ILUSA University of Liverpool, Mechanical, Materials & Aerospace Eng, LiverpoolUK
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Candès, E. J. and Wakin, M. B.. IEEE signal processing magazine 25(2), (2008), pp. 21.CrossRefGoogle Scholar
[2]Stevens, A., Yang, H., Carin, L. et al. Microscopy 63(1), (2013), pp. 41.CrossRefGoogle Scholar
[3]Kovarik, L., Stevens, A., Liyu, A. et al. Applied Physics Letters 109(16), (2016), p. 164102.CrossRefGoogle Scholar
[4]Stevens, A.. Compressive sensing in transmission electron microscopy. Ph.D. thesis, Duke Univ. (2018).Google Scholar
[5]Stevens, A., Luzi, L., Yang, H. et al. Applied Physics Letters 112(4), (2018), p. 043104.CrossRefGoogle Scholar
[6]Stevens, A., Kovarik, L., Abellan, P. et al. Adv Structural and Chemical Imaging 1(1), (2015), p. 10.CrossRefGoogle Scholar
[7]Stevens, A., Yang, H., Hao, W. et al. Applied Physics Letters 113(3), (2018), p. 033104.CrossRefGoogle Scholar
[8]Stevens, A., Pu, Y., Sun, Y. et al. Artificial Intelligence and Statistics 54, (2017), pp. 121.Google Scholar
[9]Xing, Z., Zhou, M., Castrodad, A. et al. SIAM Journal on Imaging Sciences 5(1), (2012), pp. 33.CrossRefGoogle Scholar
[10]Becker, S., Bobin, J. and Candès, E. J.. SIAM Journal on Imaging Sciences 4(1), (2011), pp. 1.CrossRefGoogle Scholar
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