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Low Voltage Analytical Possibilities in a Scanning Electron Microscope in Transmission Mode at 30 kV: EDS, EELS and CBED at the Nanoscale

Published online by Cambridge University Press:  01 August 2018

Raynald Gauvin ,
Hendrix Demers  and
Nicolas Brodusch
Raynald Gauvin
Affiliation:
Department of Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 0C5.
Hendrix Demers
Affiliation:
Department of Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 0C5. Centre d’excellence en électrification des transports et stockage d’énergie, Hydro-Québec, Varennes, Québec, Canada, J3X 1S1.
Nicolas Brodusch
Affiliation:
Department of Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 0C5.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2036 - 2037
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Demers, H., Brodusch, N. Gauvin, R. (2017) Microscopy and Microanalysis 23(S1), 1044–1045.Google Scholar
[2] Brodusch, N., Demers, H. Gauvin, R. (2018) Scanning Electron Microscopy, New Perspectives in Materials Characterization. Springer.Google Scholar