Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-06-23T23:31:12.981Z Has data issue: false hasContentIssue false
  • English
  • Français

Low Energy X-Ray Transmission Images by using a Microfocus X-Ray Tube and a be-Window X-Ray Image Intensifier(XRII)

Published online by Cambridge University Press:  02 July 2020

H. Konuma ,
K. Kuroki ,
K. Kurosawa  and
N. Saitoh
H. Konuma
Affiliation:
National Research Institute of Police Science, 6 Sanban-cho, Chiyoda-ku, Tokyo, 102Japan
K. Kuroki
Affiliation:
National Research Institute of Police Science, 6 Sanban-cho, Chiyoda-ku, Tokyo, 102Japan
K. Kurosawa
Affiliation:
National Research Institute of Police Science, 6 Sanban-cho, Chiyoda-ku, Tokyo, 102Japan
N. Saitoh
Affiliation:
National Research Institute of Police Science, 6 Sanban-cho, Chiyoda-ku, Tokyo, 102Japan
Get access

Extract

Photographs of x-ray transmission images by x-ray films have been used for observing the inside nondestructively. Further, Imaging Plates(IP) are used for precise measurements of x-ray diffraction patterns. But, these integrating area detectors are not suitable for real time nor time resolved measurements. For real time and time resolved measurements, the X-Ray Image Intensifier(XRII, a large image tube that converts an x-ray image into a visible image) is used for biological x-ray TV systems, x-ray nondestructive inspection systems etc. These TV x-ray image systems require high energy x-rays, x-ray tube voltage of 30 to 150 kV, and show faint contrast for x-ray images of light element substances owing to its low absorption coefficients. However, light elements have intense x-ray absorption coefficients in a low energy x-ray region, x-ray tube voltage of 5 to 20 kV, and give fine contrast for x-ray images of light element substances.

Type
Microscopy and Microanalysis in the “Real World”
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 494 - 495
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Amemia, Y. et al., Rev. Sci. lustrum. 66,2290(1995).CrossRefGoogle Scholar
2.Kuroki, K. et al., SPIE Vol.2942, 105(1997).Google Scholar
3.Konuma, H. et al., Extended abstracts 2 (The 45st Spring Meeting, 1998) The Japan Society of Applied Physics and Related Societies.Google Scholar