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Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector

Published online by Cambridge University Press:  05 August 2019

Kenji Tsuda
Affiliation:
Frontier Institute for Interdisciplinary Research, Tohoku University, Sendai, Japan.
Ryusuke Sagawa
Affiliation:
JEOL Ltd., Tokyo, Japan.
Hiroki Hashiguchi
Affiliation:
JEOL Ltd., Tokyo, Japan.
Yukihito Kondo
Affiliation:
JEOL Ltd., Tokyo, Japan.
Corresponding
E-mail address:
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Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Tanaka, M and Tsuda, K, J. Electron Microsc. 60 (S1) (2011), p. S245.Google Scholar
[2]Tsuda, K and Tanaka, M, Acta Cryst. A55 (1999), p. 939.CrossRefGoogle Scholar
[3]Ogata, Y, Tsuda, K and Tanaka, M, Acta. Cryst. A64 (2008), p. 587.CrossRefGoogle Scholar
[4]Tsuda, K et al. , Phys. Rev. B 81 (2010), p. 180102.CrossRefGoogle Scholar
[5]Tsuda, K., Yasuhara, A and Tanaka, M, Appl. Phys. Lett. 102 (2013), p. 051913.CrossRefGoogle Scholar
[6]Tsuda, K and Tanaka, M, Appl. Phys. Express 8, (2015), p. 081501.CrossRefGoogle Scholar
[7]Tsuda, K and Tanaka, M, Appl. Phys. Express 9 (2016), p. 071501.CrossRefGoogle Scholar
[8]Tsuda, K and Tanaka, M, Jpn. J. Appl. Phys. 56 (2017), p. 10PB09.CrossRefGoogle Scholar
[9]Cochran, W, Adv. Phys. 9 (1960), p. 387.CrossRefGoogle Scholar
[10]Sagawa, R et al. , Microsc. Microanal. 23 (S1) (2017), p. 52.CrossRefGoogle Scholar
[11]An author (KT) is grateful to Emer. Prof. Michiyoshi Tanaka and Prof. Masami Terauchi for their stimulating discussion and support.Google Scholar
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