Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-24T19:42:48.177Z Has data issue: false hasContentIssue false

It's All About Contrast: Multifrequency Resonant and IR Methods in AFM

Published online by Cambridge University Press:  30 July 2020

Greg Haugstad
Affiliation:
University of Minnesota, Characterization Facility, Minneapolis, Minnesota, United States
Andrew Avery
Affiliation:
Unilever Research, Bebington, England, United Kingdom

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Frontiers in Spectroscopy and Microscopy Part I - Doping and Mobility
Copyright
Copyright © Microscopy Society of America 2020

References

Haugstad, G., Atomic Force Microscopy: Understanding Basic Modes and Advanced Appplications (Wiley, 2012).10.1002/9781118360668CrossRefGoogle Scholar