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Interfacial Energy-Dispersive Spectroscopy Profile X-Ray Resolution Measurements in Variable Pressure SEM

Published online by Cambridge University Press:  24 June 2014

Abdelhalim Zoukel ,
Lahcen Khouchaf ,
Jean Di Martino  and
David Ruch
Abdelhalim Zoukel
Affiliation:
Univ-Lille Nord de France, Ecole des Mines de Douai, 941 rue Charles Bourseul, BP 10838, 59500 Douai, France Department of Advanced Materials and Structures, Centre de Recherche Public Henri Tudor, 5 rue Bommel, L-4940 Hautcharage, Luxembourg
Lahcen Khouchaf*
Affiliation:
Univ-Lille Nord de France, Ecole des Mines de Douai, 941 rue Charles Bourseul, BP 10838, 59500 Douai, France
Jean Di Martino
Affiliation:
Department of Advanced Materials and Structures, Centre de Recherche Public Henri Tudor, 5 rue Bommel, L-4940 Hautcharage, Luxembourg
David Ruch
Affiliation:
Department of Advanced Materials and Structures, Centre de Recherche Public Henri Tudor, 5 rue Bommel, L-4940 Hautcharage, Luxembourg
*
*Corresponding author. lahcen.khouchaf@mines-douai.fr
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Abstract

A procedure has been developed to follow degradation of energy-dispersive spectroscopy (EDS) X-ray lateral resolution in a variable pressure scanning electron microscope. This procedure is based on evaluation of the EDS profile shape change for different experimental conditions. Some parameters affecting the X-ray resolution in high-vacuum mode have been taken into account. Good agreement between the simulated and experimental EDS profiles shows the reliability of the proposed procedure. A significant improvement in measurement of the EDS profile interfacial distance (DINT) has been achieved.

Keywords

variable pressure scanning electron microscopespatial resolutioninterfaceEDS profileX-ray microanalysisinterfacial distance
Type
Instrumentation and Techniques Development
Information
Microscopy and Microanalysis , Volume 20 , Issue 5 , October 2014 , pp. 1565 - 1575
Copyright
© Microscopy Society of America 2014 

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