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Interfacial electrical conductivity controlled crystallization of amorphous LaAlO3under electron-beam irradiation

Published online by Cambridge University Press:  25 July 2016

G. Y. Lee
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea Center for Noncrystalline Materials, Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea
J. Y. Kim
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea Research Institute of Advanced Materials, Seoul National University, Seoul, South Korea
S. Y. Moon
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea
S. H. Baek
Affiliation:
Electronic Materials Research Center, Korea Institute of Science and Technology, Seoul, South Korea
D. H. Kim
Affiliation:
Center for Noncrystalline Materials, Department of Materials Science and Engineering, Yonsei University, Seoul, South Korea
H. J. Chang
Affiliation:
Advanced Analysis Center, Korea Institute of Science and Technology, Seoul, South Korea

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rijnders, G. & Blank., D. H. A. Nature 433 (2005). p. 369.CrossRefGoogle Scholar
[2] Reyren, N., Thiel, S., Caviglia, A. D., Kourkoutis, L. F., Hammerl, G., Richter, C., Schneider, C. W., Kopp, T., Ruetschi, A. S., Jaccard, D., Gabay, M., Muller, D. A., Triscone, M. J. & Mannhart, J. Science 317 (2007). p. 1196.Google Scholar
[3] Wang, X., Lu, W. M., Annadi, A., Liu, Q. Z., Gopinadhan, K., Dhar, S. & Venkatesan, T. Ariando, Physical Review B 84 (2011). p. 075312.Google Scholar
[4] Ohtomo, A. & Hwang., H. Y. Nature 427 (2004). p. 423.Google Scholar
[5] Sambri, A., et al., Phys. Lett. 100 (2012). p. 231605.Google Scholar