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Intelligent Microscopy: A Path Toward Tailored Materials at the Atomic Scale

Published online by Cambridge University Press:  30 July 2021

Mitra Taheri ,
James Hart  and
Cassandra Pate
Mitra Taheri
Affiliation:
Johns Hopkins University, United States
James Hart
Affiliation:
Johns Hopkins University, United States
Cassandra Pate
Affiliation:
Johns Hopkins University, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 962 - 963
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Hart, J.L., Lang, A.C., Leff, A.C., Longo, P., Trevor, C., Twesten, R.D. and Taheri, M.L., 2017. Direct detection electron energy-loss spectroscopy: a method to push the limits of resolution and sensitivity. Scientific reports, 7(1), pp. 1-14.CrossRefGoogle ScholarPubMed
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Hart, J.L., Hantanasirisakul, K., Lang, A.C., Li, Y., Mehmood, F., Pachter, R., Frenkel, A.I., Gogotsi, Y. and Taheri, M.L., 2021. Multimodal Spectroscopic Study of Surface Termination Evolution in Cr2TiC2Tx MXene. Advanced Materials Interfaces, p.2001789.CrossRefGoogle Scholar
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