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Installation of Lau Interferometer into X-Ray Microscope system for Phase-CT Measurement

Published online by Cambridge University Press:  10 August 2018

Hidekazu Takano*
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Yukinori Nagatani
Affiliation:
National Institute for Physiological Sciences, Okazaki, Japan
Songzhe Lian
Affiliation:
Faculty of Engineering, Information and Systems, University of Tsukuba, Tsukuba, Japan
Koh Hashimoto
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Yanlin Wu
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Atsushi Momose
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
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Abstract

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© Microscopy Society of America 2018 

References

[1] Yashiro, W., et al, Phys Rev Lett 103 2009 180801.CrossRefGoogle Scholar
[2] Kuwabara, H., et al, Appl. Phys. Express 4 2011 062502.CrossRefGoogle Scholar
[3] Takano, H., et al, Proc. SPIE 10391 2017 1039110.Google Scholar
[4] This work was supported by JST ERATO (grant No. JPMJER1403). The authors thank Carl Zeiss X-Ray Microscopy Inc. (Pleasanton, CA, USA) for help in installing the grating interferometer into the ZEISS Xradia 800 Ultra X-ray microscope.Google Scholar
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