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In-situ Ion Irradiation and Recrystallization in Highly Structured Materials

Published online by Cambridge University Press:  05 August 2019

Jeffery A. Aguiar*
Affiliation:
Idaho National Laboratory, Nuclear Materials Department, Idaho Falls, IdahoUSA.
Anthony Monterrosa
Affiliation:
Sandia National Laboratories, Center for Integrated Nanotechnologies Albuquerque, New MexicoUSA.
Bryan Reed
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CaliforniaUSA.
Daniel Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CaliforniaUSA.
Seongtae Kwon
Affiliation:
Idaho National Laboratory, Nuclear Materials Department, Idaho Falls, IdahoUSA.
Matthew L. Gong
Affiliation:
University of Utah, Scientific Computing Imaging Institute, Department of Electrical and Computer Engineering, Salt Lake City, UtahUSA.
Tolga Tasdizen
Affiliation:
University of Utah, Scientific Computing Imaging Institute, Department of Electrical and Computer Engineering, Salt Lake City, UtahUSA.
Benjamin Coryell
Affiliation:
Idaho National Laboratory, Nuclear Materials Department, Idaho Falls, IdahoUSA.
Katherine Jungjohann
Affiliation:
Sandia National Laboratories, Center for Integrated Nanotechnologies Albuquerque, New MexicoUSA.
Khalid Hattar
Affiliation:
Sandia National Laboratories, Center for Integrated Nanotechnologies Albuquerque, New MexicoUSA.
Erik Luther
Affiliation:
Los Alamos National Laboratory, Los Alamos, New MexicoUSA.
Howard T. Hartman
Affiliation:
Idaho National Laboratory, Nuclear Materials Department, Idaho Falls, IdahoUSA.
*
*Corresponding author: Jeffery.Aguiar@inl.gov
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Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Misra, A., Demkowicz, M.J., Zhang, X., Hoagland, R.G., The radiation damage tolerance of ultra-high strength nanolayered composites, JOM. 59 (2007) 6265. doi:10.1007/s11837-007-0120-6.CrossRefGoogle Scholar
[2]Wei, Q.M., Wang, Y.Q., Nastasi, M., Misra, A., Nucleation and growth of bubbles in He ion-implanted V/Ag multilayers, Philos. Mag. 91 (2011) 553573. doi:10.1080/14786435.2010.526647.CrossRefGoogle Scholar
[3]Yu-Zhang, K., Embury, J.D., Han, K., Misra, A., Transmission electron microscopy investigation of the atomic structure of interfaces in nanoscale Cu–Nb multilayers, Philos. Mag. 88 (2008) 25592567. doi:10.1080/14786430802380485.CrossRefGoogle Scholar
[4]Hattar, K., Bufford, D.C., Buller, D.L., Concurrent in situ ion irradiation transmission electron microscope, Nucl. Instrum. Methods Phys. Res. Sect. B Beam Interact. Mater. At. 338 (2014) 5665. doi:10.1016/j.nimb.2014.08.002.CrossRefGoogle Scholar
[5](IUCr) Investigations on the structural disordering of neutron-irradiated highly oriented pyrolytic graphite by X-ray diffraction and electron microscopy, (n.d.). https://onlinelibrary.wiley.com/iucr/doi/10.1107/S0021889805004292 (accessed February 11, 2019).Google Scholar
[6]Work supported through the INL Laboratory Directed Research& Development (LDRD) Program under DOE Idaho Operations Office Contract DE-AC07-05ID14517. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government.Google Scholar
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