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In-Situ Investigation of Phase Transitions in Functional Poly-Vinylidene Fluoride

Published online by Cambridge University Press:  30 July 2021

Suman Kumari
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, United States
Tugba Isik
Affiliation:
School of Mechanical Engineering, Purdue University, United States
Ceren Yilmaz Akkaya
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, Storrs, Connecticut, United States
Volkan Ortalan
Affiliation:
Department of Materials Science and Engineering, University of Connecticut, United States

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Shaik, H. et al. Towards β-phase formation probability in spin coated PVDF thin films. Journal of Polymer Research vol. 24 (2017).Google Scholar
Riosbaas, M. T., Loh, K. J., O'Bryan, G. & Loyola, B. R. In situ phase change characterization of PVDF thin films using Raman spectroscopy. Sensors Smart Struct. Technol. Civil, Mech. Aerosp. Syst. 2014 9061, 90610Z (2014).Google Scholar
Ye, Y., Jiang, Y., Wu, Z. & Zeng, H. Phase transitions of poly(vinylidene fluoride) under electric fields. Integr. Ferroelectr. 80, 245251 (2006).Google Scholar
Horibe, H. et al. Quantification of the solvent evaporation rate during the production of three PVDF crystalline structure types by solvent casting. Polym. J. 46, 104110 (2014).CrossRefGoogle Scholar
Vijayan, S. In Situ Investigation of Thermally Activated Processes Using MEMS-Based Devices: Practical Challenges & Applications. (2018).Google Scholar
Mele, L. et al. A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/transmission electron microscopes. Microsc. Res. Tech. 79, 239250 (2016).CrossRefGoogle ScholarPubMed