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In-situ Atomic-Resolution Observations of Oxide-Reduction Induced Formation of Nano-Holes in Cu2O Thin Films

Published online by Cambridge University Press:  01 August 2018

Xiaobo Chen
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Dongxiang Wu
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Lianfeng Zou
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Qiyue Yin
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Hanlei Zhang
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Dmitri N. Zakharov
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY
Eric A. Stach
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA
Guangwen Zhou
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Zou, L., et al, Nat. Commun. 8 2017) p. 307.Google Scholar
[2] Zhou, G. Yang, J. Phys. Rev. Lett. 93 2004) p. 226101.Google Scholar
[3] This work was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Award No. DE-SC0001135. This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DE-SC0012704..Google Scholar