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The in situ Studies on the Anomalous Domain Switching Caused by Trace Amount of Oxygen Vacancies

Published online by Cambridge University Press:  05 August 2019

Shaobo Cheng
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
Qingping Meng
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
Myung-Geun Han
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
Shiqing Deng
Affiliation:
School of Materials Science and Engineering, Tsinghua University, Beijing, P. R. China.
Xing Li
Affiliation:
Department of Engineering Physics, Zhengzhou University, Zhengzhou, Henan, P. R. China.
Gianluigi A. Botton
Affiliation:
Canadian Centre for Electron Microscopy and Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada.
Yimei Zhu*
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
*
*Corresponding author: zhu@bnl.gov

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Cheng, S et al. , Science Advances 4 (2018), eaar4298.Google Scholar
[2]Li, X et al. , Nanomaterials 8 (2018), p. 188.Google Scholar
[3]Cheng, S et al. , Physical Review Letters 118 (2017), p. 145501.Google Scholar
[4]Cheng, S et al. , Advanced Electronic Materials (2019), p. 1800827.Google Scholar
[5]Li, X et al. , Advanced Materials Interfaces 6 (2018), p. 1701246.Google Scholar
[6]The electron microscopy work was carried out at Brookhaven National Laboratory and supported by the U.S. DOE Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DESC0012704.Google Scholar