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The in situ Studies on the Anomalous Domain Switching Caused by Trace Amount of Oxygen Vacancies

Published online by Cambridge University Press:  05 August 2019

Shaobo Cheng
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
Qingping Meng
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
Myung-Geun Han
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
Shiqing Deng
Affiliation:
School of Materials Science and Engineering, Tsinghua University, Beijing, P. R. China.
Xing Li
Affiliation:
Department of Engineering Physics, Zhengzhou University, Zhengzhou, Henan, P. R. China.
Gianluigi A. Botton
Affiliation:
Canadian Centre for Electron Microscopy and Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada.
Yimei Zhu*
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA.
*
*Corresponding author: zhu@bnl.gov
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Cheng, S et al. , Science Advances 4 (2018), eaar4298.CrossRefGoogle Scholar
[2]Li, X et al. , Nanomaterials 8 (2018), p. 188.CrossRefGoogle Scholar
[3]Cheng, S et al. , Physical Review Letters 118 (2017), p. 145501.CrossRefGoogle Scholar
[4]Cheng, S et al. , Advanced Electronic Materials (2019), p. 1800827.CrossRefGoogle Scholar
[5]Li, X et al. , Advanced Materials Interfaces 6 (2018), p. 1701246.CrossRefGoogle Scholar
[6]The electron microscopy work was carried out at Brookhaven National Laboratory and supported by the U.S. DOE Basic Energy Sciences, Materials Sciences and Engineering Division under Contract No. DESC0012704.Google Scholar
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