In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

Y. Homma

doi:10.1017/S1431927603444553

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In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

Published online by Cambridge University Press: 01 August 2003

Y. Homma

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Y. Homma*: Affiliation:
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation, Atsugi, Kanagawa 243-0198, Japan

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 910 - 911

DOI: https://doi.org/10.1017/S1431927603444553 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

Volume 9, Issue S02
Y. Homma ^(a1)
DOI: https://doi.org/10.1017/S1431927603444553

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In Situ Observations Using Ultrahigh Vacuum Scanning Electron Microscopy

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