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In situ Imaging of Materials using X-ray Tomography

Published online by Cambridge University Press:  01 August 2018

Brian M. Patterson
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Nikolaus L. Cordes
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Kevin Henderson
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Xianghui Xiao
Affiliation:
X-ray Photon Sciences, Argonne National Laboratory, Argonne, IL, USA
Nikhilesh Chawla
Affiliation:
4D Materials Science Center, Arizona State University, Tempe, AZ
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Abstract

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Copyright
© Microscopy Society of America 2018 

References

[1] Chapman, N.C., et. al., Materials Science and Technology 31(5 2015 573578.CrossRefGoogle Scholar
[2] Singh, S.S., et. al., Corrosion Science 104 2016 330335.CrossRefGoogle Scholar
[3] Patterson, B.M., et. al., Exp Mech 56(9 2016 15851597.CrossRefGoogle Scholar
[4] Patterson, B.M., et. al., Microscopy and Microanalysis 95 2014 1826.Google Scholar
[5] Mertens, J.C.E., et. al., Journal of Materials Science 52(20 2017 1218512206.CrossRefGoogle Scholar
[6] Patterson, B.M., et. al., Journal of Material Science 51(1 2016 171187.CrossRefGoogle Scholar
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