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In Situ and Cryo (S)TEM Imaging of Internal Microgel Architectures

Published online by Cambridge University Press:  21 December 2016

Tobias Caumanns ,
Arjan Gelissen ,
Alexander Oppermann ,
Pascal Hebbeker ,
Rahul Tiwari ,
Sarah Turnhoff ,
Dominik Wöll ,
Andreas Walther ,
Joachim Mayer  and
Walter Richtering
Tobias Caumanns
Affiliation:
Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, GERMANY
Arjan Gelissen
Affiliation:
Institute of Physical Chemistry, RWTH Aachen University, Aachen, GERMANY
Alexander Oppermann
Affiliation:
Institute of Physical Chemistry, RWTH Aachen University, Aachen, GERMANY
Pascal Hebbeker
Affiliation:
Institute of Physical Chemistry, RWTH Aachen University, Aachen, GERMANY
Rahul Tiwari
Affiliation:
Leibniz-Institute for Interactive Materials, RWTH Aachen University, Aachen, GERMANY
Sarah Turnhoff
Affiliation:
Institute of Physical Chemistry, RWTH Aachen University, Aachen, GERMANY
Dominik Wöll
Affiliation:
Institute of Physical Chemistry, RWTH Aachen University, Aachen, GERMANY
Andreas Walther
Affiliation:
Leibniz-Institute for Interactive Materials, RWTH Aachen University, Aachen, GERMANY
Joachim Mayer
Affiliation:
Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, GERMANY
Walter Richtering
Affiliation:
Institute of Physical Chemistry, RWTH Aachen University, Aachen, GERMANY

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S5: Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , November 2016 , pp. 70 - 71
Copyright
© Microscopy Society of America 2016 

References

[1] Lu, Y, et al, J Mater Chem 19 (2009). pp. 3955–3961.Google Scholar
[2] Mergel, O, et al, J Phys Chem C 118 (2014). pp. 26199–26211.Google Scholar
[3] Kleinen, J, Klee, A & Richtering, W Langmuir 26 (2010). pp. 11258–11265.Google Scholar
[4] de Jonge, N & Ross, F M Nat Nanotechnol 6 (2011). pp. 695–704.CrossRefGoogle Scholar
[5] Gelissen, A, et al, Nano Lett. 2016 16, pp. 7295–730.Google Scholar
[6] The authors kindly acknowledge the financial support by the DFG through the SFB 985.Google Scholar