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Improving 4DSTEM measurements of atomic charge and electrostatic potential via energy filtration

Published online by Cambridge University Press:  30 July 2021

Thomas Pekin ,
Marcel Schloz ,
Benedikt Haas ,
Wouter Van den Broek  and
Christoph Koch
Thomas Pekin
Affiliation:
Humboldt Universität zu Berlin, United States
Marcel Schloz
Affiliation:
Humboldt Universität zu Berlin, United States
Benedikt Haas
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States
Wouter Van den Broek
Affiliation:
Humboldt Universität zu Berlin, Berlin, Berlin, United States
Christoph Koch
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1450 - 1452
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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