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Improved sample preparation of beam-sensitive ultra-thin cuprate films

Published online by Cambridge University Press:  05 August 2019

Vesna Srot*
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Yi Wang
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Ute Salzberger
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Bernhard Fenk
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Marion Kelsch
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Matteo Minola
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Marco Salluzzo
Affiliation:
CNR-SPIN Napoli Complesso Monte Sant’ Angelo via Cinthia, Napoli, Italy Dipartimento di Fisica “E. Pancini” Complesso Monte Sant' Angelo via Cinthia, Napoli, Italy
Gabriella Maria De Luca
Affiliation:
CNR-SPIN Napoli Complesso Monte Sant’ Angelo via Cinthia, Napoli, Italy Dipartimento di Fisica “E. Pancini” Complesso Monte Sant' Angelo via Cinthia, Napoli, Italy
Bernhard Keimer
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
Peter A. van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Germany
*
*Corresponding author: V.Srot@fkf.mpg.de

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Salluzzo, M et al. Phys rev B 78 (2008), 054524.Google Scholar
[2]Wang, Y et al. , Ultramicroscopy 168 (2016) 46.Google Scholar
[3]Srot, V et al. , Microscopy and Microanalysis 24 (2018) 76.Google Scholar
[4]This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar