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Imaging Lattice Distortions in High Entropy Alloys at Multiple Length Scales Using Electron Nanodiffraction and 4D-STEM

Published online by Cambridge University Press:  30 July 2020

Haw-Wen Hsiao ,
Yu-Tsun Shao ,
Renliang Yuan  and
Jian-Min Zuo
Haw-Wen Hsiao
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Yu-Tsun Shao
Affiliation:
Cornell University, Ithaca, New York, United States
Renliang Yuan
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 978 - 980
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Copyright
Copyright © Microscopy Society of America 2020

References

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Yuan, R., Zhang, J., and Zuo, J.-M., Lattice strain mapping using circular Hough transform for electron diffraction disk detection. Ultramicroscopy, 2019. 207: p. 112837.10.1016/j.ultramic.2019.112837CrossRefGoogle ScholarPubMed