Hostname: page-component-7c8c6479df-7qhmt Total loading time: 0 Render date: 2024-03-28T17:35:39.479Z Has data issue: false hasContentIssue false

Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges

Published online by Cambridge University Press:  05 August 2019

G. Naresh-Kumar*
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
A. Alasamari
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
Ben Hourahine
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
C. Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
*
*Corresponding author: naresh.gunasekar@strath.ac.uk

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zaefferer, S. and Elhami, N-N., Acta Materialia 75 (2014), p. 20.Google Scholar
[2]Naresh-Kumar, G. et al. , Materials Science in Semiconductor Processing 47, (2016), p. 44.Google Scholar
[3]Kriaa, H., Guitton, A. and Maloufi, N. Scientific Reports 7, (2017), p. 9742.Google Scholar
[4]Danilatos, G. D. Journal of Microscopy, 245 (2012) p. 171.Google Scholar
[5]The authors acknowledge support from the EPSRC grant; “Quantitative non-destructive nanoscale characterisation of advanced materials” (EP/P015719/1).Google Scholar