Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-17T15:54:53.679Z Has data issue: false hasContentIssue false
  • English
  • Français

Image Processing for Quality Enhancement of 2D Dopant Distribution Maps of MOSFET's using Electron Holography

Published online by Cambridge University Press:  05 September 2003

A. Lenk ,
U. Mühle  and
H. Lichte
A. Lenk
Affiliation:
Triebenberg Laboratory, Institute of Applied Physics (IAPD), University of Dresden, D-01062 Dresden, Germany
U. Mühle
Affiliation:
Infineon Technologies Dresden, Germany
H. Lichte
Affiliation:
Triebenberg Laboratory, Institute of Applied Physics (IAPD), University of Dresden, D-01062 Dresden, Germany
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 222 - 223
Copyright
Copyright © Microscopy Society of America 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)