Hostname: page-component-7c8c6479df-r7xzm Total loading time: 0 Render date: 2024-03-28T21:01:41.177Z Has data issue: false hasContentIssue false

High-Q photonic chip-based temporal phase plates for electron microscopy

Published online by Cambridge University Press:  30 July 2021

Armin Feist
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Arslan Sajid Raja
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Jan-Wilke Henke
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Junqiu Liu
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Germaine Arend
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Guanhao Huang
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Fee Jasmin Kappert
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Rui Ning Wang
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Jiahe Pan
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Ofer Kfir
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, United States
Tobias Kippenberg
Affiliation:
Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, Switzerland, United States
Claus Ropers
Affiliation:
4th Physical Institute – Solids and Nanostructures, University of Göttingen, Göttingen, Germany, Goettingen, Niedersachsen, Germany

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Fast and Ultrafast Dynamics Using Electron Microscopy
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

England, R. J. et al. , Rev. Mod. Phys. 86, 13371389 (2014).CrossRefGoogle Scholar
Priebe, K. E. et al. , Nat. Photonics 11, 793 (2017).CrossRefGoogle Scholar
Morimoto, Y. and Baum, P., Nat. Phys. 14, 252 (2018).CrossRefGoogle Scholar
Kozák, M. et al. , Phys. Rev. Lett. 120, 103203 (2018).CrossRefGoogle Scholar
Schwartz, O. et al. Nat. Methods 16, 10161020 (2019).CrossRefGoogle Scholar
Vanacore, G. M. et al. , Nat. Mater. 18, 573579 (2019).CrossRefGoogle Scholar
Feist, A. et al. , Phys. Rev. Research 2, 043227 (2020).CrossRefGoogle Scholar
Barwick, B., Flannigan, D. J., and Zewail, A. H., Nature 462, 902 (2009).CrossRefGoogle Scholar
J, F.. de Abajo, García, et al. , Rev. Mod. Phys. 82, 00346861 (2010).Google Scholar
Kfir, O. et al. , Nature 582, 4649 (2020).CrossRefGoogle Scholar
Wang, K. et al. , Nature 582, 5054 (2020).CrossRefGoogle Scholar
Feist, A. et al. , Ultramicroscopy 176, 63 (2017).CrossRefGoogle Scholar
Liu, J. et al. , Optica 5, 13471353 (2018).CrossRefGoogle Scholar
Echternkamp, K. E. et al. , Nature Physics 12, 10001004 (2016)CrossRefGoogle Scholar
Kfir, O. et al. , Phys. Rev. Lett. 123, 10 (2019).CrossRefGoogle Scholar