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High-efficiency Fast X-Ray Imaging Detector Development at SSRF

Published online by Cambridge University Press:  01 August 2018

Xie Honglan ,
Zhao Chengqiang ,
Du Guohao ,
Luo Hongxin ,
Xu Wendong  and
Xiao Tiqiao
Xie Honglan
Affiliation:
Shanghai Institute of Applied Physics, Shanghai Synchrotron Radiation Facility, Shanghai, China
Zhao Chengqiang
Affiliation:
Shanghai Institute of Optics and Fine Mechanics, Res Lab High Dens Opt Storage, Shanghai, China
Du Guohao
Affiliation:
Shanghai Institute of Applied Physics, Shanghai Synchrotron Radiation Facility, Shanghai, China
Luo Hongxin
Affiliation:
Shanghai Institute of Applied Physics, Shanghai Synchrotron Radiation Facility, Shanghai, China
Xu Wendong
Affiliation:
Shanghai Institute of Optics and Fine Mechanics, Res Lab High Dens Opt Storage, Shanghai, China
Xiao Tiqiao
Affiliation:
Shanghai Institute of Applied Physics, Shanghai Synchrotron Radiation Facility, Shanghai, China

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1006 - 1007
Copyright
© Microscopy Society of America 2018 

References

[1] Xie, H., et al, JINST 11 2016) p. C03057.Google Scholar
[2] Zhang, Y., et al, Nuclear Techniques 37 2014) p. 70102.Google Scholar
[3] Authors acknowledge funding: National key research and development program 2017YFA0403801.Google Scholar