Hostname: page-component-7c8c6479df-5xszh Total loading time: 0 Render date: 2024-03-28T11:36:16.284Z Has data issue: false hasContentIssue false

High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated byIn SituTEM and X-ray Diffraction

Published online by Cambridge University Press:  25 July 2016

Q. Jeangros
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
M. Duchamp
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Jülich Research Centre, Jülich, Germany
E. Rucavado
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
F. Landucci
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland Interdisciplinary Centre for Electron Microscopy, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
C. Spori
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Jülich Research Centre, Jülich, Germany
C. Hébert
Affiliation:
Interdisciplinary Centre for Electron Microscopy, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland
M. Morales-Masis
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
C. Ballif
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland
A. Hessler-Wyser
Affiliation:
Photovoltaics and Thin Film Electronics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Neuchâtel, Switzerland

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Morales-Masis, M, et al., Advanced Functional Materials 26 (2016). p. 384.Google Scholar
[2] Voyles, PM & Muller, DA Ultramicroscopy 93 (2002). p. 147.Google Scholar
[3] Feldmann, F, et al., Applied Physics Letters 104 (2014). p. 181105.Google Scholar
[4] Support is gratefully acknowledged from the Swiss National Science Foundation (project CRSII2_154474, “Impact of composition and nanometer scale DISorder in transparent Conductive Oxides: a new route to design materials with enhanced transport properties (DisCO)”). The authors wish to thank Dr. O. Sereda, Dr. I. Marozau and J. Tillier for access to an in situ X-ray diffractometer.Google Scholar