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High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1636 - 1637
- Copyright
- © Microscopy Society of America 2018
References
[5] This work was supported by National Science Foundation CAREER AWARD (NSF CAREER grant #424-36 61X4).Google Scholar
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