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High Resolution EELS of Point Defects in a Nitride Semiconductor Material

Published online by Cambridge University Press:  01 August 2018

Katia March ,
Shuo Wang ,
Fernando A. Ponce  and
Peter Rez
Katia March
Affiliation:
Eyring Materials Center, OKED, Arizona State University, Tempe, AZ.
Shuo Wang
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ.
Fernando A. Ponce
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ.
Peter Rez
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 430 - 431
Copyright
© Microscopy Society of America 2018 

References

[1] Wang, S., et al, J. Cryst. Growth 475 2017) p. 334.Google Scholar
[2] The use of facilities within the Eyring Materials Center at Arizona State University is acknowledged. X. Li, T. Detchprohm and R.D. Dupuis are acknowledged for growing the materials.Google Scholar