Skip to main content Accessibility help
×
Home
Hostname: page-component-544b6db54f-prt4h Total loading time: 0.229 Render date: 2021-10-18T09:10:22.656Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

A High Multiple Hits Correction Factor for Atom Probe Tomography

Published online by Cambridge University Press:  01 August 2018

D.J. Larson
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
R.M. Ulfig
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
A. Merkulov
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711 USA
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Jagutzki, O, et al., IEEE Trans. Nucl. Sci. 49 2002) p. 2477.CrossRefGoogle Scholar
[2] Da Costa, G, et al., Rev. Sci. Instrum. 76 2005) p. 0133040133041.CrossRefGoogle Scholar
[3] Miller, MK Smith, GDW. Atom Probe Microanalysis: Principles and Applications to Materials Problems, (Materials Research Society, Pittsburgh) 1989.Google Scholar
[4] Da Costa, G, et al., Rev. Sci. Instrum. 83 2012) p. 123709.CrossRefGoogle Scholar
[5] Ronsheim, P, et al., Appl. Surf. Sci. 255 2008) p. 1547.CrossRefGoogle Scholar
[6] Blavette, D, et al., Mater. Sci. Eng. A. 7 2011) p. 0120040120041.Google Scholar
[7] Philippe, T, et al., Ultramicroscopy. 109 2009) p. 1304.CrossRefGoogle Scholar
[8] Larson, DJ, et al., Microsc. Microanal. 20 2014) p. 2088.CrossRefGoogle Scholar
[9] Stevie, F. Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization. Momentum Press 2015.Google Scholar
You have Access
1
Cited by

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

A High Multiple Hits Correction Factor for Atom Probe Tomography
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

A High Multiple Hits Correction Factor for Atom Probe Tomography
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

A High Multiple Hits Correction Factor for Atom Probe Tomography
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *