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Growth and Stability of Bi films on Si(111) studied by LEEM

Published online by Cambridge University Press:  01 August 2003

G.E. Thayer ,
J.T. Sadowski ,
J.B. Hannon  and
R.M. Tromp
G.E. Thayer
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598, USA
J.T. Sadowski
Affiliation:
Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku 980-8577, Sendai Japan
J.B. Hannon
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598, USA
R.M. Tromp
Affiliation:
IBM T.J. Watson Research Center, Yorktown Heights, NY 10598, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 906 - 907
Copyright
Copyright © Microscopy Society of America 2003