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Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps

Published online by Cambridge University Press:  08 April 2017

A Darbal ,
K Ganesh ,
K Barmak ,
G Rohrer ,
P Ferreira ,
T Sun  and
K Coffey
A Darbal
Affiliation:
Carnegie Mellon University
K Ganesh
Affiliation:
University of Texas, Austin
K Barmak
Affiliation:
Carnegie Mellon University
G Rohrer
Affiliation:
Carnegie Mellon University
P Ferreira
Affiliation:
University of Texas, Austin
T Sun
Affiliation:
University of Central Florida
K Coffey
Affiliation:
University of Central Florida

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1426 - 1427
Copyright
Copyright © Microscopy Society of America 2011