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Fundamental limit to single-atom analysis by STEM-EDX spectroscopy

Published online by Cambridge University Press:  04 August 2017

M. Watanabe
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015.
R.F. Egerton
Affiliation:
Physics Department, University of Alberta, Edmonton, Canada T6G 2E1.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Fu, Q., Saltsburg, H. & Flytzani-Stephanopoulos, M. Science 301 2003). p. 935.CrossRefGoogle Scholar
[2] Yang, M, et al, J. Am. Chem. Soc 135 2013). p. 3768.CrossRefGoogle Scholar
[3] Allard, LF, Duan, S. & Liu, J Microsc. Microanal 22(Suppl. 3 2016). p. 876.CrossRefGoogle Scholar
[4] Egerton, RF, et al, Ultramicroscopy 110 2010). p. 991.Google Scholar
[5] Seltzer, SM & Berger, M.J. Atomic Data & Nuclear Data Tables 35 1986). p. 345.Google Scholar
[6] Egerton, RF Microsc. Microanal 19 2013). p. 479.Google Scholar
[7] Suenaga, K, et al, Nature Photonics 6 2012). p. 545.Google Scholar
[8] Lovejoy, T, et al, Appl.Phys. Lett 100(2012), 154101.CrossRefGoogle Scholar
[9] MW wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229. RFE is grateful to NSERC for funding.Google Scholar