Hostname: page-component-76fb5796d-45l2p Total loading time: 0 Render date: 2024-04-25T07:18:15.184Z Has data issue: false hasContentIssue false
  • English
  • Français

Full-field Spectral Measurement of a Synchrotron Beam After a Multi-layer Monochromator Using a Hyperspectral X-ray Camera.

Published online by Cambridge University Press:  10 August 2018

Matthieu N. Boone ,
Frederic Van Assche ,
Sander Vanheule ,
Silvia Cipiccia ,
Hongchang Wang ,
Laszlo Vincze  and
Luc Van Hoorebeke
Matthieu N. Boone
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium
Frederic Van Assche
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium
Sander Vanheule
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium
Silvia Cipiccia
Affiliation:
Diamond Light source, Diamond House, Harwell Science and Innovation Campus, Fermi Ave, Didcot OX11 0DE
Hongchang Wang
Affiliation:
Diamond Light source, Diamond House, Harwell Science and Innovation Campus, Fermi Ave, Didcot OX11 0DE
Laszlo Vincze
Affiliation:
X-ray Microspectroscopy and Imaging group (XMI), Dept. of Analytical Chemistry,Ghent University, Krijgslaan 281 S12, B-9000 Ghent, Belgium
Luc Van Hoorebeke
Affiliation:
UGCT-RP, Dept. Physics and Astronomy, Ghent University, Proeftuinstraat 86/N12, B-9000 Gent, Belgium

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 324 - 325
Copyright
© Microscopy Society of America 2018 

References

[1] Titarenko, V., etal, J. Synchr. Radiat 17 2010) p 689–699.CrossRefGoogle Scholar
[2] Scharf, O., et al, Anal. Chem. 83 2011) p 2532–2538.Google Scholar
[3] Rau, C., et al, Phys Status Solidi 208(11 2011) p 2522–2525.Google Scholar