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From Scanning Electron Nanodiffraction to 4D-STEM: How and Why Coherence Matters

Published online by Cambridge University Press:  30 July 2020

Jian-Min Zuo ,
Renliang Yuan  and
Haw-Wen Hsiao
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Renliang Yuan
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Haw-Wen Hsiao
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 966 - 967
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Copyright
Copyright © Microscopy Society of America 2020

References

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