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From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology

Published online by Cambridge University Press:  04 August 2017

Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Chris-Kriton Skylaris
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Aakash Varambhia
Affiliation:
Department of Materials, University of Oxford, Parks Road, UK.
Jolyon Aarons
Affiliation:
School of Chemistry, University of Southampton, Highfield, UK.
Katherine E. MacArthur
Affiliation:
Ernst Ruska Center, Forschungszentrum Julich GmbH, Julich, Germany.
Dogan Ozkaya
Affiliation:
Johnson Matthey Technology Centre, Sonning Common, Reading, UK.
Misbah Sarwar
Affiliation:
Johnson Matthey Technology Centre, Sonning Common, Reading, UK.
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Abstract

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Copyright
© Microscopy Society of America 2017 

References

[1] Jones, L., et al, Nano Lett. 14:11 2014). p. 6336.CrossRefGoogle Scholar
[2] Jones, L. IOP Conf. Ser. Mater. Sci. Eng. 109:1 2016). p. 12008.CrossRefGoogle Scholar
[3] Jones, L., et al, Adv. Struct. Chem. Imaging 1:1 2015). p. 8.CrossRefGoogle Scholar
[4] De Backer, A., et al, Ultramicroscopy 171 2016). p. 104.CrossRefGoogle Scholar
[5] De wael, A., et al, Ultramicroscopy 41:1 2017). p. 81.Google Scholar
[6] The research was supported by the European Union under Grant Agreement 312483 - ESTEEM2 and EPSRC grant code, EP/K040375/1, for the 'South of England Analytical Electron Microscope'.Google Scholar
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From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology
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