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From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1880 - 1881
- Copyright
- © Microscopy Society of America 2017
References
[6] The research was supported by the European Union under Grant Agreement 312483 - ESTEEM2 and EPSRC grant code, EP/K040375/1, for the 'South of England Analytical Electron Microscope'.Google Scholar