Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-25T07:40:46.258Z Has data issue: false hasContentIssue false
  • English
  • Français

Freezing and sublimation effects on cryo-SEM imaging and microanalysis

Published online by Cambridge University Press:  05 August 2019

Jing Liang ,
Xixi Xiao ,
Tseng-Ming Chou  and
Matthew Libera
Jing Liang
Affiliation:
Dept. of Chemical Engr. & Materials Science, Stevens Institute of Technology, Hoboken, NJ, USA.
Xixi Xiao
Affiliation:
Dept. of Chemical Engr. & Materials Science, Stevens Institute of Technology, Hoboken, NJ, USA.
Tseng-Ming Chou
Affiliation:
Laboratory for Multiscale Imaging, Stevens Institute of Technology, Hoboken, NJ, USA.
Matthew Libera
Affiliation:
Dept. of Chemical Engr. & Materials Science, Stevens Institute of Technology, Hoboken, NJ, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Element Analysis of Biological Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1108 - 1109
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wu, Yong et al. , Journal of Polymer Science Part B: Polymer Physics, 54 (2016), p. 64.Google Scholar
[2]Wu, Yong et al. , Microscopy and Microanalysis, 20 (2014), p. 1348.Google Scholar
[3]Liang, Jing et al. , Polymer, 116 (2017), p. 1.Google Scholar
[4]Liang, Jing et al. , Microscopy and Microanalysis, 22 (2016), p. 1898.Google Scholar
[5]Bryson, Charles E. III et al. , Journal of Chemical and Engineering Data, 19 (1974), p. 107.Google Scholar
[6]This work has been supported by the United States National Science Foundation (grant #DMR-1608406) and used microscopy resources supported by the National Science Foundation (grants #DMR-1428296 and DMR-0922522) and the Stevens Institute of Technology.Google Scholar