Hostname: page-component-848d4c4894-8bljj Total loading time: 0 Render date: 2024-07-07T01:35:03.119Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Ion Beam Surface Preparation for Plasma Facing Materials

Published online by Cambridge University Press:  30 July 2020

Daniel Morrall  and
Chad Parish
Daniel Morrall
Affiliation:
Oak Ridge National Lab, Oak Ridge, Tennessee, United States
Chad Parish
Affiliation:
Oak Ridge National Lab, Oak Ridge, Tennessee, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1692 - 1693
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Parish, C., Wang, K., Doerner, R., Baldwin, M.. Grain orientations and grain boundaries in tungsten nanotendril fuzz grown under divertor-like conditions. Scripta Mat. 127 (2017) 132–13510.1016/j.scriptamat.2016.09.018CrossRefGoogle Scholar
Park, Y.C., Park, B.C., Romankov, S., Park, K.J., Yoo, J.H., Lee, Y.B., Yang, J.M.. Use of permanent marker to deposit a protection layer against FIB damage in TEM specimen preparation. Journal of Microscopy. 255 (2014) 180–18710.1111/jmi.12150CrossRefGoogle ScholarPubMed
Ziegler, J.F., Biersack, J.P., Ziegler, M.D.. The stopping and range of ions in matter. Lulu press. Ver. 7 (2008)Google Scholar
Research supported by US Department of Energy, Office of Science, Fusion Energy Sciences (including an Early Career Award), under contract number DE-AC05-00OR22725. RPD and MJW supported by DOE grant number: DE-FG02-07ER54912Google Scholar