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The First Years of the Aberration-Corrected Electron Microscopy Century

Published online by Cambridge University Press:  31 July 2012

Philip E. Batson
Philip E. Batson*
Affiliation:
Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, Piscataway, NJ 08854, USA
*
Corresponding author. E-mail: batson@physics.rutgers.edu
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Abstract

Aberration correction, after a 50 year incubation period of developing ideas and techniques while awaiting enabling technology, has transformed electron microscopy during the first dozen years of the 21st century. Some of the conditions that accompanied this transformation, the required complexity and its effect on the way microscopy is pursued, recent results that promise to change the field, and directions for the future are briefly described.

Keywords

aberration correctionSTEMTEMHAADFEELS
Type
Special Section: Aberration-Corrected Electron Microscopy
Information
Microscopy and Microanalysis , Volume 18 , Issue 4 , August 2012 , pp. 652 - 655
Copyright
Copyright © Microscopy Society of America 2012

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