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ζ–Factor Development and Quantification of a Boron Carbide and Silicon Hexaboride Diffusion Couple

Published online by Cambridge University Press:  01 August 2018

CJ Marvel ,
A Etzold ,
V Domnich ,
KD Behler ,
JC LaSalvia ,
RA Haber ,
M Watanabe  and
MP Harmer
CJ Marvel
Affiliation:
Lehigh University, Department of Materials Science and Engineering, Bethlehem, PA, United States
A Etzold
Affiliation:
Rutgers University, Department of Materials Science and Engineering, Piscataway, NJ, United States
V Domnich
Affiliation:
Rutgers University, Department of Materials Science and Engineering, Piscataway, NJ, United States
KD Behler
Affiliation:
Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD, United States Survice Engineering, Belcamp, MD 21017, United States
JC LaSalvia
Affiliation:
Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD, United States
RA Haber
Affiliation:
Rutgers University, Department of Materials Science and Engineering, Piscataway, NJ, United States
M Watanabe
Affiliation:
Lehigh University, Department of Materials Science and Engineering, Bethlehem, PA, United States
MP Harmer
Affiliation:
Lehigh University, Department of Materials Science and Engineering, Bethlehem, PA, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 742 - 743
Copyright
© Microscopy Society of America 2018 

References

References:

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[3] Proctor, J.E., et al, Journal of Physics Condensed Matter 27 2014) p. 015401.Google Scholar
[4] Behler, K.D., et al, Scripta Materialia 142 2018) p. 106–110.Google Scholar
[5] Watanabe, M. Williams, D.B. Journal of Microscopy 221 2006) p. 89–109.Google Scholar
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