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ζ–Factor Development and Quantification of a Boron Carbide and Silicon Hexaboride Diffusion Couple

Published online by Cambridge University Press:  01 August 2018

CJ Marvel
Affiliation:
Lehigh University, Department of Materials Science and Engineering, Bethlehem, PA, United States
A Etzold
Affiliation:
Rutgers University, Department of Materials Science and Engineering, Piscataway, NJ, United States
V Domnich
Affiliation:
Rutgers University, Department of Materials Science and Engineering, Piscataway, NJ, United States
KD Behler
Affiliation:
Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD, United States Survice Engineering, Belcamp, MD 21017, United States
JC LaSalvia
Affiliation:
Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD, United States
RA Haber
Affiliation:
Rutgers University, Department of Materials Science and Engineering, Piscataway, NJ, United States
M Watanabe
Affiliation:
Lehigh University, Department of Materials Science and Engineering, Bethlehem, PA, United States
MP Harmer
Affiliation:
Lehigh University, Department of Materials Science and Engineering, Bethlehem, PA, United States
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Abstract

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© Microscopy Society of America 2018 

References

[1] Domnich, V., et al, Journal of the American Ceramic Society 94 2011) p. 36053628.CrossRefGoogle Scholar
[2] Subhash, G., et al, Scripta Materializ 123 2016) p. 158162.CrossRefGoogle Scholar
[3] Proctor, J.E., et al, Journal of Physics Condensed Matter 27 2014) p. 015401.CrossRefGoogle Scholar
[4] Behler, K.D., et al, Scripta Materialia 142 2018) p. 106110.CrossRefGoogle Scholar
[5] Watanabe, M. Williams, D.B. Journal of Microscopy 221 2006) p. 89109.CrossRefGoogle Scholar
[6] Keast, V.J. Williams, D.B. Journal of Microscopy 199 2000) p. 4555.CrossRefGoogle Scholar
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ζ–Factor Development and Quantification of a Boron Carbide and Silicon Hexaboride Diffusion Couple
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