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Expanding the Dimensions of a High Dynamic Range Detector with a Limited Number of Pixels via Scripting

Published online by Cambridge University Press:  05 August 2019

Xi Chen
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
Tim B. Eldred
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
Mostafa Abdelhamid
Affiliation:
Department of Electrical and Computer Engineering, North Carolina State University, Raleigh, NC, USA
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
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Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ryll, H et al. , JINST 11 (2016), P04006CrossRefGoogle Scholar
[2]Jiang, Y et al. , Nature 559 (2018), P343-349CrossRefGoogle Scholar
[3]Chen, Z et al. , Ultramicroscopy 169 (2016), P107121CrossRefGoogle Scholar
[4]Tate, MW et al. , Microsc. Microanal 22 (2016), P237CrossRefGoogle Scholar
[5]Yang, H et al. , J. Phys.: Conf. Ser. 644 (2015), P012032Google Scholar
[6]We acknowledge support for this work from the Air Force Office of Scientific Research (FA9550-17-1-0225. This work was performed in part at the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation (award number ECCS-1542015). The AIF is a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI).Google Scholar
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