Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-23T10:59:38.640Z Has data issue: false hasContentIssue false
  • English
  • Français

Examining Atomistic Defect-Boundary Interactions Induced by Ion Irradiation using Aberration Corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  09 October 2013

J.A. Aguiar ,
M. Chi ,
P. Kotula ,
Z. Bi ,
O. Anderoglu ,
J.K. Baldwin ,
J.A. Valdez ,
A. Misra  and
B. Uberuaga
J.A. Aguiar
Affiliation:
M. Chi
Affiliation:
P. Kotula
Affiliation:
Z. Bi
Affiliation:
O. Anderoglu
Affiliation:
J.K. Baldwin
Affiliation:
J.A. Valdez
Affiliation:
A. Misra
Affiliation:
B. Uberuaga
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1982 - 1983
Copyright
Copyright © Microscopy Society of America 2013