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Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Characterization of Geological and Extraterrestrial Samples
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[2]Haschke, M, “Laboratory Micro-X-Ray Fluorescence Spectroscopy” Springer (2014), 356 p.Google Scholar
[3]Haschke, M & Boehm, S, in “Advances in Imaging and Electron Physics” ed. Hawkes, (2017) p.1-60.Google Scholar
[5]The authors gratefully acknowledge materials received from the reference collection of the National Museum of the American Indian, Smithsonian Institution.Google Scholar
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