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Examination of Graphene in a Scanning Low Energy Electron Microscope

Published online by Cambridge University Press:  23 September 2015

Ilona Mullerová ,
Eliška Mikmeková  and
Luděk Frank
Ilona Mullerová
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Eliška Mikmeková
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic
Luděk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments ASCR, v.v.i., Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 29 - 30
Copyright
Copyright © Microscopy Society of America 2015 

References

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[5] Zhou, W, et al, Microscopy and Microanalysis 18 (2012), p. 1342.CrossRefGoogle Scholar
[6] Mullerova, I & Frank, L, Advances in Imaging and Electron Physics 128 (2003), p. 309.CrossRefGoogle Scholar
[7] The authors acknowledge funding from the Technology Agency of the Czech Republic (Competence center Electron microscopy, no: TE01020118) and from the MEYS of the Czech Republic (LO1212).Google Scholar