Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-30T15:58:10.720Z Has data issue: false hasContentIssue false
  • English
  • Français

Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)

Published online by Cambridge University Press:  24 July 2003

Jun S. Lee ,
Joonhyung Kwon ,
Sang-il Park  and
Changmo Sung
Jun S. Lee
Affiliation:
Center for Advanced Materials, University of Massachusetts, LowellMA 01854
Joonhyung Kwon
Affiliation:
PSIA Corporation, Seocho-dong 1600-3, Seoul 137-070, Korea
Sang-il Park
Affiliation:
PSIA Corporation, Seocho-dong 1600-3, Seoul 137-070, Korea
Changmo Sung
Affiliation:
Center for Advanced Materials, University of Massachusetts, LowellMA 01854

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1240 - 1241
Copyright
Copyright © Microscopy Society of America 2003