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Electrostatic Subframing and Compressive Sensing Video in In Situ Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

B. W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
A. A. Moghadam
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
R. S. Bloom
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
S. T. Park
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
A. M. Monterrosa
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
P. M. Price
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
C. M. Barr
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
S. A. Briggs
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA Oregon State University, Corvallis, OR 97331, USA
K. Hattar
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87123, USA
D. J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Pleasanton, CA, USA
Corresponding
E-mail address:
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Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Reed, B. W. et al. , Microsc. Microanal. 24 (suppl. 1), 494 (2018).CrossRefGoogle Scholar
[2]This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Award Number DE-SC0013104. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE's National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or the United States Government. Document SAND2019-1905 CGoogle Scholar
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Electrostatic Subframing and Compressive Sensing Video in In Situ Transmission Electron Microscopy
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