Skip to main content Accessibility help
×
Home
Hostname: page-component-55b6f6c457-ln9sz Total loading time: 0.521 Render date: 2021-09-28T02:36:57.076Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Electrostatic Potential Mapping by Secondary-electron Voltage-contrast and Electron-beam-induced-current in TEM

Published online by Cambridge University Press:  04 August 2017

Myung-Geun Han
Affiliation:
Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY, USA
Joseph A. Garlow
Affiliation:
Materials Science and Engineering Department, Stony Brook University, Stony Brook, NY, USA
Yimei Zhu
Affiliation:
Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY, USA
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] McCartney, M. R., et al, Ultramicroscopy 110 2010). p. 375.CrossRefGoogle Scholar
[2] Han, M.-G., et al, Ultramicroscopy 177 2017). p. 14.Google Scholar
[3] This work was supported by the Materials Science and Engineering Divisions, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No. DESC0012704. Authors are thankful to C. H. Ahn (Yale Univ.), S. S. Wong (Stony Brook Univ.), and S.-W. Cheong (Rutgers Univ.) for their samples.Google Scholar
You have Access

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Electrostatic Potential Mapping by Secondary-electron Voltage-contrast and Electron-beam-induced-current in TEM
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Electrostatic Potential Mapping by Secondary-electron Voltage-contrast and Electron-beam-induced-current in TEM
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Electrostatic Potential Mapping by Secondary-electron Voltage-contrast and Electron-beam-induced-current in TEM
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *