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Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials

Published online by Cambridge University Press:  25 July 2016

Frédéric Voisard
Affiliation:
McGill University, Department of Mining and Materials Engineering, Montréal, Canada
Hendrix Demers
Affiliation:
McGill University, Department of Mining and Materials Engineering, Montréal, Canada
Michel Trudeau
Affiliation:
Institut de Recherche Hydro Québec, IREQ, Varennes, Canada
George P. Demopoulos
Affiliation:
McGill University, Department of Mining and Materials Engineering, Montréal, Canada
Karim Zaghib
Affiliation:
Institut de Recherche Hydro Québec, IREQ, Varennes, Canada

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

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