No CrossRef data available.
Article contents
Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials
Published online by Cambridge University Press: 25 July 2016
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927616007315/resource/name/firstPage-S1431927616007315a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1294 - 1295
- Copyright
- © Microscopy Society of America 2016
References
References:
[3]
Probst, C, Demers, H & Gauvin, R
MicroscMicroanalMicrosc. Microanal.
vol. 18
no. 3, pp. 628–637, 2012.Google Scholar
[5]
Antony, J.
“2 - Fundamentals of Design of Experiments,”. in
Design of Experiments for Engineers and Scientists. Butterworth-Heinemann, Oxford) pp. 6–16, 2003.Google Scholar