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Early stages of phase decomposition in NiAu alloy thin films studied by in situ TEM using ultrafast quenching methods

Published online by Cambridge University Press:  30 July 2021

Johanna Schubert
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Johannes Will
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Germany
Thomas Przybilla
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Mingjian Wu
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany
Erdmann Spiecker
Affiliation:
Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), Interdisciplinary Center for Nanostructured Films (IZNF), Department of Materials Science and Engineering, Friedrich-Alexander University Erlangen-Nürnberg (FAU), Erlangen, Germany, Erlangen, Bayern, Germany

Abstract

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Type
Investigating Phase Transitions in Functional Materials and Devices by In Situ/Operando TEM
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Manna, I.; Pabi, S.K.; Gust, W. International Materials Reviews 2001 46/2, 53-91CrossRefGoogle Scholar
Niekiel, F.; Kraschewski, S.M.; Müller, J.; Butz, B.; Spiecker, E. Ultramicroscopy 2017 176, 161-169Google Scholar
Niekiel, F.; Kraschewski, S.M.; Schweizer, P.; Butz, B.; Spiecker, E. Acta Materialia 2016 115, 230-241CrossRefGoogle Scholar
The authors thank the DFG for financial support within the framework of the research training group GRK1896 ‘In situ Microscopy with Electrons, X-rays and Scanning Probes’Google Scholar